Anritsu 682XXB - Manual (Page 465)

682XXB/683XXB MM A-227
3-7 Frequency Synthesis Tests (Continued)
Coarse Loop/YIG Loop Test Procedure (Continued)
Test Frequency (in GHz) Measured Value * Test Frequency (in GHz) Measured Value *
51.000 000 000
52.000 000 000
53.000 000 000
54.000 000 000
55.000 000 000
_____________________
_____________________
_____________________
_____________________
_____________________
56.000 000 000
57.000 000 000
58.000 000 000
59.000 000 000
60.000 000 000
_____________________
_____________________
_____________________
_____________________
_____________________
* Specification for all frequencies listed above is
±
100 Hz.
Fine Loop Test Procedure (Standard 68X87B) Fine Loop Test Procedure (68X87B with Option 11)
Test Frequency (in Ghz) Measured Value ** Test Frequency (in Ghz) Measured Value ***
1.000 001 000
1.000 002 000
1.000 003 000
1.000 004 000
1.000 005 000
1.000 006 000
1.000 007 000
1.000 008 000
1.000 009 000
1.000 010 000
_____________________
_____________________
_____________________
_____________________
_____________________
_____________________
_____________________
_____________________
_____________________
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1.000 000 100
1.000 000 200
1.000 000 300
1.000 000 400
1.000 000 500
1.000 000 600
1.000 000 700
1.000 000 800
1.000 000 900
1.000 001 000
_____________________
_____________________
_____________________
_____________________
_____________________
_____________________
_____________________
_____________________
_____________________
_____________________
** Specifications for all frequencies listed above is ± 100 Hz. *** Specification for all frequencies listed above is ± 10 Hz.
TEST MODEL
RECORD 68287B/68387B