Chapter 4 - calibration, 1 introduction 4-3, 2 recommended test equipment 4-3 – Anritsu 682XXB User Manual

Page 113: 3 test records 4-3, Test equipment, 4-3, Introduction -3, Recommended test equipment -3, Test records -3, Chapter 4 calibration

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Chapter 4
Calibration

4-1

INTRODUCTION

This chapter contains procedures for calibrating the Series 682XXB/
683XXB Synthesized Signal Generators. These procedures are typi-
cally performed because out-of-tolerance conditions have been noted
during performance verification testing (see Chapter 3) or as a result
of replacement of subassemblies or RF components.

NOTE

The calibration procedures herein support operating firm-
ware versions as follows: series 682XXB models–Version
1.01 and above; series 683XXB models–Version 1.01 and
above; series 682X5B/683X5B models–Version 1.00 and
above. It is recommended that you upgrade your instru-
ment’s operating firmware to the latest available version
prior to calibration.

4-2

RECOMMENDED TEST
EQUIPMENT

Table 4-1 (page 4-4) provides a list of the recommended test equipment
for these calibration procedures.

The procedures refer to specific test equipment front panel control
settings when the test setup is critical to making accurate measure-
ments. In some cases, the user may substitute test equipment having
the same critical specifications as those on the recommended test
equipment list.

Contact your local

ANRITSU

service center (Refer to Table 1-5 on page

1-18) if you need clarification of any equipment or procedural refer-
ence.

4-3

TEST RECORDS

A blank copy of a sample calibration test record for each 682XXB/
683XXB model is provided in Appendix A. Each test record contains
model-specific variables called for by the calibration procedures. It
also provides a means for maintaining an accurate and complete
record of instrument calibration. We recommend that you copy these
pages and use them to record the results from (1) your initial calibra-
tion of out-of-tolerance 682XXB/683XXB circuits, or (2) your initial
calibration of the 682XXB/683XXB following replacement of subassem-
blies or RF components. These initial readings can be used later as
benchmark values for future tests of the same serial-numbered
instruments.

682XXB/683XXB MM

4-3

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