NEC PD750008 - Manual (Page 230)

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µPD750008 USER'S MANUAL
6.10 TEST FUNCTION
6.10.1 Test Sources
The µPD750008 has two test sources. INT2 provides two types of edge-detection-test inputs.
Table 6-5. Test Source
Test source Internal/external
INT2 (detection of the rising edge of the signal input to the INT2 pin or that of External
the first falling edge of the signals input to KR0 to KR7)
INTW (signal from clock timer) Internal
6.10.2 Hardware to Control Test Functions
(1) Test request flags, test enable flags
Test request flags (IRQxxx) are set to 1 when the corresponding test requests (INTxxx) are issued. Clear
the test request flags to 0 with the software once the test processing has been executed.
Test enable flags (IExxx) correspond to test request flags. The test enable flags enable the standby
release signal when they are set to 1. They disables the standby release signal when they are set to 0.
When both a test request flag and the corresponding test enable flag are set to 1, the standby release
signal is generated.
Table 6-6 shows the signals which set test request flags.
Table 6-6. Signals Setting Test Request Flags
Test request flag Signals setting test request flags Test enable flag
IRQW Signal from the clock timer. IEW
IRQ2 Detection of the rising edge of INT2/P12 pin input signal or IE2
the first falling edge of the signals input to the KR0/P60 to
KR7/P73 pins. The detection edge is selected with the INT2
edge detection mode register (IM2).