Teledyne 9110T - Nitrogen Oxides Analyzer - Manual (Page 173)

Model 9110TH NOx Analyzer Data Acquisition System (DAS) and APICOM
Teledyne Analytical Instruments 173
To modify, add or delete a parameter, follow the instruction shown in Section 7.1.3 then press:
Starting at the EDIT CHANNEL MENU
SETUP X.X 0) CONC: ATIMER 5, 800
PREV NEXT INS DEL EDIT PRNT EXIT
SETUP X.X NAME: CONC
<SET SET> EDIT EXIT
Continue pressing <SET or SET> until ...
SETUP X.X PARAMETER:5
<SET SET > EDIT EXIT
SETUP X.X 0) PARAM=NXCNC1, MODE=AVG
PREV NEXT INS DEL EDIT EXIT
SETUP X.X EDIT PARAMS (DELETE DATA)?
YES NO
YES deletes all data
currently stored for
this data channel and
continues into EDIT
mode.
NO retains the
data and
returns to the
previous
menu.
SETUP X.X PARAMETER:NXCNC1
<SET SET> EDIT EXIT
SETUP X.X PARAMETER:NXCNC1
PREV NEXT ENTR EXIT
SETUP X.X SAMPLE MODE:AVG
<SET SET> EDIT EXIT
SETUP X.X PARAMETER:NXCNC1
INST AVG SDEV MIN MAX ENTR EXIT
Press the desired
MODE button.
SETUP X.X PRECISION:4
<SET SET> EDIT EXIT
SETUP X.X PRECISION:5
5 ENTR EXIT
Toggle this button to
set from 1 to 4.
SETUP X.X STOR NUM SAMPLE:OFF
<SET EDIT EXIT
SETUP X.X STOR NUM SAMPLE:OFF
OFF ENTR EXIT
Toggle this button to
turn ON/OFF.
Pressing <SET
returns to the
previous Function.
EXIT discards the new
setting.
ENTR accepts the
new setting.
Toggle these buttons to
cycle through the list of
available parameters.
PRINT
PREV
INS
NEXT
DEL
Button
Exports the configuration of all data channels to the
RS-232 interface
Selects the previous data channel or parameter
Inserts a new data channel or parameter into the list
BEFORE the selected channel
Selects the next data channel or parameter
Deletes the currently selected data channel or
parameter
FUNCTION
Buttons only appear when applicable
DAS EDIT – Touchscreen Functions
EDIT Enters EDIT mode
<SET
SET>
Selects the previous property to be edited
Selects the next property to be edited
Toggle these
buttons to select a
different parameter.
Note When the STORE NUM SAMPLES feature is turned on, the instrument will
store the number of measurements that were used to compute the AVG,
SDEV, MIN or MAX value but not the actual measurements themselves.