4 breakpoint/test mode select (bkpt/tms), 7 test clock (tck), 16 test signals – Freescale Semiconductor MCF5480 User Manual

Page 100: 1 test mode (mtmod[3:0]), Breakpoint/test mode select (bkp, Test clock (tck) -30, Test signals -30, Test mode (mtmod[3:0]) -30

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4 breakpoint/test mode select (bkpt/tms), 7 test clock (tck), 16 test signals | 1 test mode (mtmod[3:0]), Breakpoint/test mode select (bkp, Test clock (tck) -30, Test signals -30, Test mode (mtmod[3:0]) -30 | Freescale Semiconductor MCF5480 User Manual | Page 100 / 1032 4 breakpoint/test mode select (bkpt/tms), 7 test clock (tck), 16 test signals | 1 test mode (mtmod[3:0]), Breakpoint/test mode select (bkp, Test clock (tck) -30, Test signals -30, Test mode (mtmod[3:0]) -30 | Freescale Semiconductor MCF5480 User Manual | Page 100 / 1032
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This manual is related to the following products:

MCF5485, MCF5483, MCF5484, MCF5482, MCF5481

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