2 test clock input (tck), 3 test mode select/breakpoint (tms/bkpt), Test clock input (tck) -3 – Freescale Semiconductor MCF5480 User Manual

Page 711: Test mode select/breakpoint (tms/bkp

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2 test clock input (tck), 3 test mode select/breakpoint (tms/bkpt), Test clock input (tck) -3 | Test mode select/breakpoint (tms/bkp | Freescale Semiconductor MCF5480 User Manual | Page 711 / 1032 2 test clock input (tck), 3 test mode select/breakpoint (tms/bkpt), Test clock input (tck) -3 | Test mode select/breakpoint (tms/bkp | Freescale Semiconductor MCF5480 User Manual | Page 711 / 1032
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This manual is related to the following products:

MCF5485, MCF5483, MCF5484, MCF5482, MCF5481

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