4 enable_test_ctrl instruction, 5 highz instruction, 6 clamp instruction – Freescale Semiconductor MCF5480 User Manual
Page 717: 7 bypass instruction, 5 initialization/application information, 1 restrictions, 2 nonscan chain operation, Enable_test_ctrl instruction -9, Highz instruction -9, Clamp instruction -9
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4 enable_test_ctrl instruction, 5 highz instruction, 6 clamp instruction | 7 bypass instruction, 5 initialization/application information, 1 restrictions, 2 nonscan chain operation, Enable_test_ctrl instruction -9, Highz instruction -9, Clamp instruction -9 | Freescale Semiconductor MCF5480 User Manual | Page 717 / 1032
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