INFICON IQM-233 Thin Film Deposition Controller PCI-Express Card Codeposition Software Operating Manual User Manual

Page 102

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IQS-233 Operating Manual

Time (Phase) . . . . . . . . . . . The left-side displays the time remaining until the

current phase ends. The right-side displays the
elapsed time for:

entire preconditioning phase

Deposition phase

entire Feed phase

entire Idle phase

Progress . . . . . . . . . . . . . . . Bar graph displaying an indication of the progress of

the current phase.

Film . . . . . . . . . . . . . . . . . . . The name of the Film used for the current Layer.

Rate Å/s . . . . . . . . . . . . . . . The calculated rate of deposition at the substrate. If

more than one sensor is mapped to the Output used
by the current Layer, the displayed rate is an
average of the rates for those individual sensors.

NOTE: To display the Readings window where

Rates for individual sensors are displayed,
click View >> Sensor Readings on the menu
bar.

Rate stability is affected by the PID loop
values in the Deposit tab on the Film Edit
window. Refer to

section 2.3.3.5.8 on

page 2-31

.

Rate accuracy is affected by:

Density and Z-Ratio values in the
Materials window. Refer to

section 2.3.3.5.12 on page 2-42

.

Tooling value(s) in the Source/Sensor tab
on the Film Edit window. Refer to

section 2.3.3.5.10 on page 2-36

.

Period value in the Card tab on the
System Setup window. Refer to

section 2.3.3.6.5 on page 2-56

.

Dev (%) . . . . . . . . . . . . . . . . Percentage deviation of the Rate (Å/Sec) display

from the desired rate setting in the Source Setup
window.

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