3 bypass register, 4 jtag_cfm_clkdiv register, 5 test_ctrl register – Freescale Semiconductor MCF5480 User Manual

Page 713: Bypass register -5, Jtag_cfm_clkdiv register -5, Test_ctrl register -5

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Memory Map/Register Definition

MCF548x Reference Manual, Rev. 3

Freescale Semiconductor

23-5

23.3.2.3

Bypass Register

The bypass register is a single-bit shift register path from TDI to TDO when the BYPASS instruction is

selected.

23.3.2.4

JTAG_CFM_CLKDIV Register

The JTAG_CFM_CLKDIV register is a 7-bit clock divider for the CFM that is used with the

LOCKOUT_RECOVERY instruction. It controls the period of the clock used for timed events in the CFM

erase algorithm. The JTAG_CFM_CLKDIV register must be loaded before the lockout sequence can

begin.

23.3.2.5

TEST_CTRL Register

The TEST_CTRL register is a 3-bit shift register path from TDI to TDO when the

ENABLE_TEST_CTRL instruction is selected. The TEST_CTRL transfers its value to a parallel hold

register on the rising edge of TCK when the TAP state machine is in the update-DR state.

31

30

29

28

27

26

25

24

23

22

21

20

19

18

17

16

R

JTAGID

W

Reset

See

Table 23-4

Reg

Addr

MBAR + 0x50

15

14

13

12

11

10

9

8

7

6

5

4

3

2

1

0

R

JTAGID

W

Reset

See

Table 23-4

Reg

Addr

MBAR + 0x50

Figure 23-2. JTAG IDCODE Register

Table 23-4. JTAG IDCODE Field Descriptions

Bits

Name

Description

31–0

JTAGID

The JTAG identification number register is a read only register which contains the JTAG ID
number for the MCF548x. Its value is hard coded and cannot be modified.
Values for the MCF548x are the following:
MCF5485 0x0800c01d
MCF5484 0x0800d01d
MCF5483 0x0800e01d
MCF5482 0x0800f01d
MCF5481 0x0801001d
MCF5480 0x0801101d

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