Rockwell Automation 1336T FORCE Series B User Manual
Page 233
Chapter 6
Troubleshooting
6–21
Because the test results depend on your particular system, you can
disable tests that may give questionable or nuisance faults. Use
Transistor Diagnostics Configuration (parameter 257) to disable
individual tests:
If you want to disable:
Then, set
this bit:
Current feedback phase U offset tests
0
Current feedback phase W offset tests
1
Shorted power transistor tests
2
Ground fault tests
3
Open transistor, open motor, open current feedback,
open gate drive, and open bus fuse tests
4
Power transistor U upper for all tests
6
Power transistor U lower for all tests
7
Power transistor V upper for all tests
8
Power transistor V lower for all tests
9
Power transistor W upper for all tests
10
Power transistor W lower for all tests
11
Bits 5 and 13 through 15 are reserved. You must leave these bits 0.
Even though you set bits 6 through 11 to disable the individual tests, you
will still get a fault with the other tests if there is an open in an individual
section.
To test specific modules within the power structure, you can disable any
transistor or any combination of transistors. You must leave all
transistors enabled under most conditions. Use sound judgement to
verify that power transistor fault conditions do not exist before disabling
tests.
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