INFICON STC-2000A Thin Film Deposition Controller Operating Manual - Manual (Page 129)

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STC-2000A DEPOSITION CONTROLLER
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SECTION 3.21 Programming Example
Perhaps the best way to become familiar with the STC-2000A operation and programming is to
program a simple 6 layer process of two alternating materials and then exercise the process using the test
mode of the STC-2000A. The Test Mode simulates sensor input information (actually rate info is
simulated for the film) to the unit and allows the STC-2000A to "run" a process. The source control output
voltage is, however, still fully functional. If the evaporant generating power supply is not needed for the
"test"/simulation, disconnect it. With the power supply connected, there could be some dangerous
conditions.
Entering the Test Mode
To activate the Test Mode: from the RunTime screen, press the fixed MENU key then press the
key area labeled SERVICE when the MAIN MENU is displayed. This brings up the SERVICE MENU
which provides selection of : SQ vs. non-SQ product function, return to factory settings, purge ALL stored
data, memory module functions and the test mode entry. A key labeled either "TEST OFF" or "TEST
ON" is for entry into the test mode. When in the test mode, you will notice in the crystal status area on the
upper right corner of the RunTime screen that the text, XTAL, has been replaced with the text, TEST. The
word, TEST, also appears on the 3
rd
STATUS screen in the LIFE column when a reporting sensor channel
is without a crystal/oscillator. This ‘test’ mode remains in effect until the unit is turned off and back on
normally. On the Service Menu, the TEST mode key has a toggle function (ON/OFF) and the key label
alternates between TEST ON and TEST OFF. To initiate any of the Service MENU personalities, any or
all three of the key choices are toggled/selected as needed and the Accept/Restart Product key is pressed.
The product will restart with the selected personalities in effect. Only the user selected SQ/non-SQ
personality will remain in effect upon subsequent product power cycles. To enter the TEST mode, press the
TEST OFF key so that it reads TEST ON and then press the ACCEPT key. The other keys are not used.
TEST mode: "TEST"
replaces "XTAL".
If no crystal/oscillator is connected, the text "TEST"
The text "TEST" remains during simulation. will appear on the 3 rd STATUS screen.
After a simulation, process accounting will
If a crystal sensor/oscillator is connected while
show the results and add the letter "T" to in the test mode, the text "TEST" will be overwritten
indicate that this run# was in TEST mode. with life info. "TEST" will remain on the runtime
screen.
SECTION 3.XX page 129 of 292