Amplitude – Agilent Technologies Signal Analyzer N9030a User Manual
Page 1125
6 RLC Swept SA Measurement Front-Panel & SCPI Reference
Source
Amplitude
Allows you to access the Amplitude sub-menu to control various amplitude parameters of the
Source. The resolution of the Source amplitude parameters is coupled to match the minimum
resolution of the source when the source is acquired. When the source is released, the amplitude
parameter resolution reverts to default values.
Key Path
Source
Readback
In square brackets, the amplitude value from Amplitude key in the next menu level down
Initial S/W Revision
A.06.01
Amplitude
Allows you to adjust the power level of the selected source. Note that the actual amplitude is also
affected by the Amplitude Offset and Power Sweep parameters.
Key Path
Source, Amplitude
Scope
Mode Global
Remote Command
:SOURce[:EXTernal]:POWer[:LEVel][:IMMediate][:AMPLitude] <ampl>
:SOURce[:EXTernal]:POWer[:LEVel][:IMMediate][:AMPLitude]?
Example
:OUTP ON
:SOUR:POW –10dBm
Dependencies
If the requested setting of Source Amplitude causes the calculated external source start or stop
Amplitude to exceed the external source capability, a warning status message is generated,
“Data out of Range; clipped to source max/min” The “Show Source Capabilities and Settings”
menu can then be examined to check the source capabilities.
This parameter test and clip is also performed at source acquisition.
Preset
–10.00 dBm (On Source Preset and Restore Input/Output Defaults)
Not affected by Mode Preset
State Saved
Part of the Input/Output system, which means it is Loaded and Saved with state.
Min
The range of the amplitude parameter is dependent on the amplitude range of the source that is
selected, and the settings of Amplitude Offset and Power Sweep.
Max
The range of the amplitude parameter is dependent on the amplitude range of the source that is
selected, and the settings of Amplitude Offset and Power Sweep.
Backwards
Compatibility SCPI
:SOURce:POWer:STARt <ampl>
:SOURce:POWer:STARt?
Remote Language Compatibility Measurement Application Reference
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