Sweep setup – Agilent Technologies Signal Analyzer N9030a User Manual
Page 1154
6 RLC Swept SA Measurement Front-Panel & SCPI Reference
Sweep/Control
Zero Span, the Auto/Man state of Sweep Time that existed before entering Zero Span is
restored.
If Sweep Time was in Auto before entering Zero Span, or if it is set to Auto while in zero span
(which can happen via remote command or if Auto Couple is pressed) it returns to Auto and
recouples when returning to non-zero spans.
If Sweep Time was in Man before entering Zero Span, it returns to Man when returning to non-
zero spans, and any changes to Sweep Time that were made while in Zero Span are retained in
the non-zero span (except where constrained by minimum limits, which are different in and out
of zero span).
Preset
The preset Sweep Time value is hardware dependent since Sweep Time presets to “Auto”.
State Saved
Saved in instrument state
Min
in zero span: 1 µs
in swept spans: 1 ms
in Stepped Tracking (as with option ESC): same as auto sweep time
(in Swept Tracking, with Tracking Generator option T03 or T06, the minimum sweep time is 1 ms,
but the Meas Uncal indicator is turned on for sweep times faster than 50 ms)
Max
in zero span: 6000 s
in swept spans: 4000 s
Status Bits/OPC
dependencies
Meas Uncal is Bit 0 in the STATus:QUEStionable:INTegrity:UNCalibrated register
Initial S/W Revision
Prior to A.02.00
Sweep Setup
Lets you set the sweep functions that control features such as sweep type and time.
Key Path
Sweep/Control
Dependencies
The whole Sweep Setup menu is grayed out in Zero Span, however, the settings in the menus
under Sweep Setup can be changed remotely with no error indication.
Grayed out in measurements that do not support swept mode.
Blanked in modes that do not support swept mode
Initial S/W Revision
Prior to A.02.00
Sweep Time Rules
Allows the choice of three distinct sets of sweep time rules. These are the rules that are used to
set the sweep time when Sweep Time is in Auto mode. Note that these rules only apply when in the
1154
Remote Language Compatibility Measurement Application Reference