Agilent Technologies Signal Analyzer N9030a - Manual (Page 1368)

6 RLC Swept SA Measurement Front-Panel & SCPI Reference
Trace/Detector
During the sweep, the following formula is executed for each point in the trace operand, and the
corresponding point is generated for the destination trace.:
DestinationTrace = FirstTrace + Offset
The values of the trace points are assumed to be in dBm (as they are internally stored) and the
offset is in dB.
If a point in the trace operand is equal to maxtracevalue, the resultant point is also
maxtracevalue.
If a point in the trace operand is equal to mintracevalue, the resultant point is also
mintracevalue.
Example: If offset is 25 dB, then our destination trace will be higher than the operand trace by 25
dB.
Note that the Second Trace operand is not used for this function.
Key Path Trace/Detector, Math
Example :CALC:MATH TRACE1,LOFF,TRACE4,,–6.00,
Sets Trace 1 to Log Offset trace math function, sets the First Trace operand (for Trace 1) to
Trace 4, leaves the Second Trace operand (for Trace 1) unchanged (it is irrelevant for this
function) and sets the Log Offset (for Trace 1) to –6 dB.
Couplings Selecting a math mode other than Off for a trace (pressing the key or sending the equivalent
SCPI command) puts the trace in View (Update On and Display On), even if that math mode
was already selected.
State Saved The Log Offset value for each trace is saved in Instrument State
Min –100 dB
Max 100 dB
Initial S/W Revision Prior to A.02.00
Log Diff (Op1-Op2+Ref)
Offsets the difference between the First Trace operand and the Second Trace operand by a reference
and puts the result in the destination trace. This is like the A-B+DL function in some older
analyzers. The reference is entered as the active function. Each destination trace has its own
reference.
During the sweep, the following formula is executed for each point in the trace operands, and the
corresponding point is generated for the destination trace:
DestinationTrace = (FirstTrace - SecondTrace) + Reference
1368 Remote Language Compatibility Measurement Application Reference