Functional testing, Instantaneous overcurrent (50t) (be1-700c), Functional testing -14 – Basler Electric BE1-700 User Manual

Page 310: Instantaneous overcurrent (50t) (be1-700c) -14, Table 13-6. 50tp and 50tn pickup test commands -14

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FUNCTIONAL TESTING

Functional testing is a way to assess this relay's suitability for your application. Functional testing goes
beyond the more basic tests found in acceptance testing, but lacks the detailed function testing that is
part of the commissioning process.

Test each of the following functions to verify that your relay measures accurately, is within specified
tolerances, and operates correctly. These tests are also suitable for assisting in systematic
troubleshooting in the event that an operation is questioned. Revisiting the test of a specific function can
help verify whether the relay is operating within specified tolerances. For further assistance, contact
Basler Electric, Technical Support Services Department.

Refer to Figure 12-3 and Figure 12-4 for terminal locations.

The "access command" (A=) and the "exit with save commands" (E and Yes) are shown in the initial logic
setup table found in each test section. In order to include multiple test settings in each operational setting
table. The "ACCESS" and "EXIT WITH SAVE" commands are not included. However, "ACCESS" and
"EXIT WITH SAVE" are required each time a logic or operational setting is changed.

To accelerate the testing process, two protection elements may have the same setting and are tested at
the same time but with different outputs. During the pickup/dropout test, one of the elements could pick
up slightly ahead of the other, resulting in only one target being displayed. At some point in the test, apply
110% of the pickup value and verify that both targets display. Reset targets prior to each test by pressing
the HMI RESET key.

Instantaneous Overcurrent (50T) (BE1-700C)

50TP/150TP and TN (Calculated 3Io) Pickup and Dropout Verification

Purpose: To verify the accuracy of the operation of the 50/150TP and TN (3Io) elements.

Reference Commands: SL-50T/150T, SL-GROUP, SL-VO

Step 1: Connect a current source to Terminals D1 and D2 (A-phase). Refer to Figure 12-3 for terminal

locations. An ohmmeter or continuity tester may be used to monitor output contact status.

Step 2: Prepare the 50T/150T elements for testing by transmitting the commands in Table 13-6 to the

relay. Reset targets.

Table 13-6. 50TP and 50TN Pickup Test Commands

Command

Purpose

A=

Gains write access.

SL-N=NONE

Zero out custom logic settings. Overwrite with logic=none settings.

Y

Confirm overwrite.

SL-N=PU50

Sets PU50 as custom logic name.

SL-50T=1,0; SL-50TN=1,0

Enables 50TP and 50TN (3Io), and disables blocking.

SL-VO1=50TPT

Enables OUT1 to close for 50TP trip.

SL-VO2=50TNT

Enables OUT2 to close for 50TN trip.

SG-CT=1

Sets P, N CT ratio at 1:1

SG- TRIG=50TPT+50TNT,
50TPPU+50TNPU,0

Enable 50TPT or 50TNT to log and trigger fault recording.

SG-TARG=50T/150T

Enables 50T/150T targets.

EXIT;Y

Exit and save settings.

NOTE

Functional testing is not required for this device. It is necessary only when
performing a comprehensive assessment to determine suitability for an
application.

13-14

BE1-700 Testing and Maintenance

9376700990 Rev M

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