Intel CONTROLLERS 413808 - Manual (Page 793)

Intel ® 413808 and 413812 I/O Controllers in TPER Mode
October 2007 Developer’s Manual
Order Number: 317805-001US 793
Test Logic Unit and Testability—Intel ® 413808 and 413812
18.3 Definition of Terms
High-Z: An instruction defined by the IEEE 1149.1 Standard. The
requirement for this instruction are 1) all system logic outputs
are high impedance; 2) the TAP controller continues to operate
with the bypass register connected between TDI and TDO. The
part may have other settings, as long as they do not interfere
with these two requirements. Following the use of High-Z the
part may be in an indeterminate state and require a reset.
ONCE: A test mode used to test static-Icc and pin leakage. The
requirements for this mode are 1) all system logic outputs are
high impedance, including TDO; 2) all pull-ups are disables,
including TMS , TRST# , and TDI ; 3) all clocks are stopped. The
TAP controller cannot be operational in this mode.